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Introducing EZ-REF

EZ-CURVE + EZ-REF - Courtesy of LAAS-CNRS

EZ-REF – Monitor your MBE growth

Introducing EZ-REF, our latest in-situ, real-time spectral reflectivity system that brings unparalleled precision to your MBE monitoring.

Why EZ-REF ? Because Real-Time Means Real Control.

  • Live, in-situ monitoring – track growth at the wafer surface, under vacuum, with full spectral control.
  • Accurate growth rate & optical properties determination.
  • Truly multispectral – ideal for complex structures like VCSELs, with dedicated Fabry-Pérot dip tracking.
  • Smart data analysis – spectral chronograms, real-time growth rate calculation, optimal wavelength selection, and much more.
  • Fast & connected – real-time mode up to 100 Hz, compatibility with Riber Crystal XE, and remote Modbus interface.

Because in MBE, every nanometer matters, let EZ-REF take your growth monitoring to the next level.

https://www.riber.com/product/ez-ref/

Posted on Monday, February 3, 2025 - 17:47 pm

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