Introducing EZ-REF
EZ-REF – Monitor your MBE growth
Introducing EZ-REF, our latest in-situ, real-time spectral reflectivity system that brings unparalleled precision to your MBE monitoring.
Why EZ-REF ? Because Real-Time Means Real Control.
- Live, in-situ monitoring – track growth at the wafer surface, under vacuum, with full spectral control.
- Accurate growth rate & optical properties determination.
- Truly multispectral – ideal for complex structures like VCSELs, with dedicated Fabry-Pérot dip tracking.
- Smart data analysis – spectral chronograms, real-time growth rate calculation, optimal wavelength selection, and much more.
- Fast & connected – real-time mode up to 100 Hz, compatibility with Riber Crystal XE, and remote Modbus interface.
Because in MBE, every nanometer matters, let EZ-REF take your growth monitoring to the next level.
https://www.riber.com/product/ez-ref/
Posted on Monday, February 3, 2025 - 17:47 pm